Microwave distribution in stacked Bi$_{2}$Sr$_{2}$CaCu$_{2}$O$_{8+x}$ intrinsic Josephson junctions in a transmission-line geometry

摘要

The microwave distribution inside a rectangular stack (15 $\mu$m$\times$0.72$\mu$m$\times$60 nm) of Bi$_{2}$Sr$_{2}$CaCu$_{2}$O$_{8+x}$ intrinsic Josephsonjunctions (IJJs) was studied. The stack was microfabricated into atransmission-line geometry, with a few hundred nm thick Au layers deposited ontop and bottom of the stack. The microwave distribution was monitored bymeasuring the anomalous suppression of the tunneling critical current of theIJJs with varied microwave power at frequencies in the W band. This techniquecan provide valuable information on the microwave transmission modes inside thesandwiched stack of IJJs, which is utterly important for the high-frequencydevice applications using IJJs, such as fluxon-flow THz oscillators.